JANČA, Martin, Pavel ŠILER, Tomáš OPRAVIL a Jan KOTRLA. Determination accuracy of analysis refractory materials by x-ray fluorescence. In: IOP Conference Series: Materials Science and Engineering [online]. IOP Publishing, 2018, 379, s. 1-7 [cit. 2019-12-06]. DOI: 10.1088/1757-899X/379/1/012034. ISSN 1757-899X. Dostupné z: http://hdl.handle.net/11012/84145
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